1/***********************************************************************
2*                                                                      *
3*               This software is part of the ast package               *
4*          Copyright (c) 1982-2011 AT&T Intellectual Property          *
5*                      and is licensed under the                       *
6*                 Eclipse Public License, Version 1.0                  *
7*                    by AT&T Intellectual Property                     *
8*                                                                      *
9*                A copy of the License is available at                 *
10*          http://www.eclipse.org/org/documents/epl-v10.html           *
11*         (with md5 checksum b35adb5213ca9657e911e9befb180842)         *
12*                                                                      *
13*              Information and Software Systems Research               *
14*                            AT&T Research                             *
15*                           Florham Park NJ                            *
16*                                                                      *
17*                  David Korn <dgk@research.att.com>                   *
18*                                                                      *
19***********************************************************************/
20#pragma prototyped
21#ifndef TEST_ARITH
22/*
23 *	UNIX shell
24 *	David Korn
25 *	AT&T Labs
26 *
27 */
28
29#include	"FEATURE/options"
30#include	"defs.h"
31#include	"shtable.h"
32/*
33 *  These are the valid test operators
34 */
35
36#define TEST_ARITH	040	/* arithmetic operators */
37#define TEST_BINOP	0200	/* binary operator */
38#define TEST_PATTERN	0100	/* turn off bit for pattern compares */
39
40#define TEST_NE		(TEST_ARITH|9)
41#define TEST_EQ		(TEST_ARITH|4)
42#define TEST_GE		(TEST_ARITH|5)
43#define TEST_GT		(TEST_ARITH|6)
44#define TEST_LE		(TEST_ARITH|7)
45#define TEST_LT		(TEST_ARITH|8)
46#define TEST_OR		(TEST_BINOP|1)
47#define TEST_AND	(TEST_BINOP|2)
48#define TEST_SNE	(TEST_PATTERN|1)
49#define TEST_SEQ	(TEST_PATTERN|14)
50#define TEST_PNE	1
51#define TEST_PEQ	14
52#define TEST_EF		3
53#define TEST_NT		10
54#define TEST_OT		12
55#define TEST_SLT	16
56#define TEST_SGT	17
57#define TEST_END	8
58#define TEST_REP	20
59
60extern int test_unop(Shell_t*,int, const char*);
61extern int test_inode(const char*, const char*);
62extern int test_binop(Shell_t*,int, const char*, const char*);
63
64extern const char	sh_opttest[];
65extern const char	test_opchars[];
66extern const char	e_argument[];
67extern const char	e_missing[];
68extern const char	e_badop[];
69extern const char	e_tstbegin[];
70extern const char	e_tstend[];
71
72#endif /* TEST_ARITH */
73