Lines Matching defs:tests
30 or a value that depends on tests on other attributes, the form of
67 insn. EQ_ATTR tests are resolved, whenever possible, to a test that
1072 /* Make a COND with all tests but the last. Select the last value via the
1477 /* See if any tests use addresses. */
1723 rtx *tests = XNEWVEC (rtx, len);
1730 memcpy (tests, XVEC (exp, 0)->elem, len * sizeof (rtx));
1736 /* Simplify the subexpressions, and see what tests we can get rid of. */
1743 newtest = simplify_test_exp_in_temp (tests[i], insn_code, insn_index);
1744 tests[i] = newtest;
1746 newval = tests[i + 1];
1755 and discard this + any following tests. */
1757 defval = tests[i + 1];
1765 tests[j] = tests[j + 2];
1770 else if (i > 0 && attr_equal_p (newval, tests[i - 1]))
1773 merge the tests. */
1775 tests[i - 2]
1776 = insert_right_side (IOR, tests[i - 2], newtest,
1781 tests[j] = tests[j + 2];
1787 tests[i + 1] = newval;
1793 while (len > 0 && attr_equal_p (tests[len - 1], new_defval))
1801 if (! attr_equal_p (tests[i], XVECEXP (exp, 0, i)))
1821 memcpy (XVEC (newexp, 0)->elem, tests, len * sizeof (rtx));
1825 free (tests);
3928 will be required to do any conditional tests in it.
4124 /* Write out a series of tests and assignment statements to perform tests and
4516 test, and the inner CASE tests the condition. */